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當(dāng)前位置：首頁(yè) > 產(chǎn)品中心 > 二維材料 > 硒化物晶體 > 二硒化鈮晶體（百分之99.995）2H-NbSe2
簡(jiǎn)要描述：二硒化鈮晶體 2H-NbSe2（Niobium Selenide）晶體尺寸：~10毫米電學(xué)性能：金屬，半導(dǎo)體（TC ~ 7.2k） Charge Density Waves （CDW） system, Tcdw ~33K晶體結(jié)構(gòu)：六邊形晶胞參數(shù)：a = b = 0.344 nm, c = 1.255 nm, α = β = 90°, γ = 120°晶體
產(chǎn)品型號(hào)： 廠商性質(zhì)：生產(chǎn)廠家更新時(shí)間：2025-05-07訪 問(wèn) 量：2596詳細(xì)介紹
二硒化鈮晶體 2H-NbSe2(Niobium Selenide)
晶體尺寸：~10毫米
電學(xué)性能：金屬，半導(dǎo)體（TC ~ 7.2k）
Charge Density Waves (CDW) system, Tcdw ~33K
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.344 nm, c = 1.255 nm, α = β = 90°, γ = 120°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a 2H phase NbSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8
Powder X-ray diffraction (XRD) of a single crystal 2H NbSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 2H NbSe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal 2H NbSe2. Measurement was performed with a 785 nm Raman system at room temperature.
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